NIST tests methods of recovering data from smashed smartphones

Credit to Author: John E Dunn| Date: Tue, 04 Feb 2020 12:54:30 +0000

Criminals have found to their cost that reducing a device to a pile of rubble means nothing if the internal chips are still in working order.<img src=”http://feeds.feedburner.com/~r/nakedsecurity/~4/DhhD2UVxfZU” height=”1″ width=”1″ alt=””/>

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